A new method for obtaining the magnetic shape anisotropy directly from electron tomography images

• Cristian Radu,
• Ioana D. Vlaicu and
• Andrei C. Kuncser

Beilstein J. Nanotechnol. 2022, 13, 590–598, doi:10.3762/bjnano.13.51

• and washing with water, and it was air-dried at 70 °C overnight in an oven. The experimental tomographic series was acquired with a JEOL 2100 transmission electron microscope (TEM). The instrument was operated at a voltage of 200 kV and the images have been obtained in scanning transmission electron

• microscopy (STEM) operation mode, using the high-angle annular dark-field (HAADF) detectors and an appropriate camera length. The TEM specimen was prepared by a standard powder method, using a 300 Mesh, lacey Carbon, Cu grid. X-ray diffraction (XRD) has been performed on MNPs using a Bruker D8 Advance

Is the Ne operation of the helium ion microscope suitable for electron backscatter diffraction sample preparation?

• Annalena Wolff

Beilstein J. Nanotechnol. 2021, 12, 965–983, doi:10.3762/bjnano.12.73

• transmission electron microscopy (STEM), TEM, TEM selected area electron diffraction (SAED), and TEM dark-field (DF) measurements. The results for each experiment are compared to those of a non-irradiated area of the Cu TEM grid. Monte Carlo simulations of the occurring ion–solid interactions are evaluated to

• glancing angles are investigated, the former for completeness and to allow comparison to literature and the later since it is the conventionally used geometry for polishing. Changes in the crystal structure, which would lead to altered EBSD results, are assessed by EBSD measurements as well as by scanning

The role of convolutional neural networks in scanning probe microscopy: a review

• Ido Azuri,
• Irit Rosenhek-Goldian,
• Neta Regev-Rudzki,
• Georg Fantner and
• Sidney R. Cohen

Beilstein J. Nanotechnol. 2021, 12, 878–901, doi:10.3762/bjnano.12.66

• learning was also applied to reduce noise and increase the resolution in scanning electron microscopy images. An approach for creating a training dataset of low- and high-resolution image pairs from a single image, was developed by using deep learning to up-sample scanning transmission electron microscopy

• (STEM) images after nearest neighbor down-sampling. This enabled an increase in image resolution of up to 100-fold, decreasing scanning time and electron dose [120]. Another application of CNNs for STEM was for atomic defect classification [121]. The goal was to characterize defects related to Si

Characterization, bio-uptake and toxicity of polymer-coated silver nanoparticles and their interaction with human peripheral blood mononuclear cells

• Sahar Pourhoseini,
• Reilly T. Enos,
• Angela E. Murphy,
• Bo Cai and
• Jamie R. Lead

Beilstein J. Nanotechnol. 2021, 12, 282–294, doi:10.3762/bjnano.12.23

• hydration shell around NPs and should be the same as, or larger than, the core size of NPs measured by TEM. Characterization values for pristine PVP-AgNPs can be found in Table 1. Scanning transmission electron microscopy (STEM) images of 1000 µg·L−1 PVP-AgNPs in RPMI medium at the beginning of the

Scanning transmission helium ion microscopy on carbon nanomembranes

• Daniel Emmrich,
• Annalena Wolff,
• Nikolaus Meyerbröker,
• Jörg K. N. Lindner,
• André Beyer and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2021, 12, 222–231, doi:10.3762/bjnano.12.18

• -field signal, similar to scanning transmission electron microscopy (STEM). In this way, it is possible to check qualitatively the milling progress on membranes or even to determine quantitatively the thickness of a sample. Notte et al. used thickness fringes on MgO crystals for thickness determination

Effect of different silica coatings on the toxicity of upconversion nanoparticles on RAW 264.7 macrophage cells

• Cynthia Kembuan,
• Helena Oliveira and
• Christina Graf

Beilstein J. Nanotechnol. 2021, 12, 35–48, doi:10.3762/bjnano.12.3

• -aminopropyltrimethoxysilane (AHAPS), which provides the nanoparticle surface with a positive charge, increasing their interaction with the cell membrane. The particles were characterized by scanning transmission electron microscopy (STEM), dynamic light scattering (DLS), electrophoretic light scattering (ELS), and

• were prepared as described in [51]. However, instead of fluorescein isothiocyanate, rhodamine isothiocyanate was used. The functionalization with AHAPs was carried out by using the same procedure, which was also used for the silica-coated UCNPs. Characterization Scanning transmission electron

• microscopy STEM images were taken using a Hitachi SU 8030 scanning electron microscope with an electron acceleration voltage of 30 kV and a current of 20 µA. A droplet of the nanoparticle dispersion (c = 0.5–1 g/L) in either cyclohexane, for oleate-functionalized UCNP cores, or in ethanol, for silica-coated

Free and partially encapsulated manganese ferrite nanoparticles in multiwall carbon nanotubes

• Saja Al-Khabouri,
• Salim Al-Harthi,
• Toru Maekawa,
• Mohamed E. Elzain,
• Ashraf Al-Hinai,
• Ahmed D. Al-Rawas,
• Abbsher M. Gismelseed,
• Ali A. Yousif and
• Myo Tay Zar Myint

Beilstein J. Nanotechnol. 2020, 11, 1891–1904, doi:10.3762/bjnano.11.170

• microscopy (HRTEM) on a JEOL JEM-2100F microscope working at 200 kV. Partially encapsulated manganese ferrite nanoparticles were characterized using HRTEM and energy-dispersive X-ray spectroscopy (EDS); the elemental mapping was performed on a JEOL JEM-ARM200F. Scanning transmission electron microscopy (STEM

Piezotronic effect in AlGaN/AlN/GaN heterojunction nanowires used as a flexible strain sensor

• Jianqi Dong,
• Liang Chen,
• Yuqing Yang and
• Xingfu Wang

Beilstein J. Nanotechnol. 2020, 11, 1847–1853, doi:10.3762/bjnano.11.166

• contrast. Detailed structural parameters are shown in the Experimental section. Figure 1b shows a scanning transmission electron microscopy (STEM) image taken of the AlGaN/AlN/GaN heterojunction (left panel) and a corresponding high-resolution transmission electron microscopy (HRTEM) image of the GaN layer

Direct observation of the Si(110)-(16×2) surface reconstruction by atomic force microscopy

• Tatsuya Yamamoto,
• Ryo Izumi,
• Kazushi Miki,
• Takahiro Yamasaki,
• Yasuhiro Sugawara and
• Yan Jun Li

Beilstein J. Nanotechnol. 2020, 11, 1750–1756, doi:10.3762/bjnano.11.157

• ], scanning tunneling microscopy (STM) [15][16][17][18][19][20][21][22][23][24], scanning transmission electron microscopy (STEM) [25], and photoelectron spectroscopy (PES) [22][26][27]. The 16×2 reconstruction has a striped structure with upper and lower terraces and with boundaries of monatomic steps. In

Oxidation of Au/Ag films by oxygen plasma: phase separation and generation of nanoporosity

• Abdel-Aziz El Mel,
• Said A. Mansour,
• Mujaheed Pasha,
• Atef Zekri,
• Janarthanan Ponraj,
• Akshath Shetty and
• Yousef Haik

Beilstein J. Nanotechnol. 2020, 11, 1608–1614, doi:10.3762/bjnano.11.143

• presented previously. The nanoporosity in the microspheres was further confirmed by cross-sectional scanning transmission electron microscopy (STEM) imaging performed on a sample oxidized for 30 min (Figure 5). STEM-EDS analysis showed that the microspheres were comprised of silver and oxygen, and it

3D superconducting hollow nanowires with tailored diameters grown by focused He⁺ beam direct writing

• Rosa Córdoba,
• Alfonso Ibarra,
• Dominique Mailly,
• Isabel Guillamón,
• Hermann Suderow and
• José María De Teresa

Beilstein J. Nanotechnol. 2020, 11, 1198–1206, doi:10.3762/bjnano.11.104

• To investigate the dependence of the NW inner diameter on the ion beam current, scanning transmission electron microscopy (STEM) experiments were performed. We found that inner diameter of the hollow NWs changes from 5 to 28 nm, whereas the outer diameter changes from 36 to 143 nm upon increasing the

• ; acceleration voltage = 30 kV; pattern shape: spot mode; ion beam current range of 0.54 to 6.47 pA and dose range of 0.1 to 1.4 nC. Microstructure and tomography at the nanometer-scale Scanning transmission electron microscopy (STEM) imaging and EDS were carried out in a probe-corrected FEI Titan 60–300

Nickel nanoparticles supported on a covalent triazine framework as electrocatalyst for oxygen evolution reaction and oxygen reduction reactions

• Secil Öztürk,
• Yu-Xuan Xiao,
• Dennis Dietrich,
• Beatriz Giesen,
• Juri Barthel,
• Jie Ying,
• Xiao-Yu Yang and
• Christoph Janiak

Beilstein J. Nanotechnol. 2020, 11, 770–781, doi:10.3762/bjnano.11.62

• was washed off three times with acetonitrile and left to dry. Images were recorded on a FEI Tecnai G2 F20 electron microscope operated at 200 kV accelerating voltage equipped with a Gatan UltraScan 1000P detector [68]. Scanning transmission electron microscopy (STEM) images and EDX elemental mapping

• further investigated by SEM-EDX elemental mapping (Figure 3), which also shows well-dispersed nickel nanoparticles on CTF. Given that nickel was detected by EDX on the whole surface of the CTF and not only on the agglomerate Ni NPs areas, further studies were performed using scanning transmission electron

• microscopy (STEM)-EDX elemental mapping. The element compositions of defined areas (orange square) showing both a single Ni particle and its CTF support in the background are displayed in Figure S11, Supporting Information File 1. A possible reason why Ni NPs outside the NP agglomerates are not visible in

Hexagonal boron nitride: a review of the emerging material platform for single-photon sources and the spin–photon interface

• Stefania Castelletto,
• Faraz A. Inam,
• Shin-ichiro Sato and
• Alberto Boretti

Beilstein J. Nanotechnol. 2020, 11, 740–769, doi:10.3762/bjnano.11.61

• transmission electron microscopy (STEM) and CL. ZPLs in PL and CL were observed ranging from 540–720 nm. Four distinct defect classes were attributed to the observed emission range. One defect class with ZPL emission centered at 580 nm had PL and CL matching with spectral variability due to strain. This is

• . However, the PL is not sufficient to univocally identify the type of defects, while the correlation with material properties and SPEs should be performed. In [114] h-BN the quantum emission was correlated with the material’s local strain using a combination of PL, nanobeam electron diffraction, scanning

Coating of upconversion nanoparticles with silica nanoshells of 5–250 nm thickness

• Cynthia Kembuan,
• Maysoon Saleh,
• Bastian Rühle,
• Ute Resch-Genger and
• Christina Graf

Beilstein J. Nanotechnol. 2019, 10, 2410–2421, doi:10.3762/bjnano.10.231

• study, i.e., oleate-capped UCNPs with a NaYF4 host structure and doped with 18% Yb and 2% Er, were synthesized by a thermal decomposition method [16] yielding spherical particles of low polydispersity. A typical scanning transmission electron microscopy (STEM) image is shown in Figure 1A. The diameter

• in 10 mL of EtOH. Characterization Scanning transmission electron microscopy (STEM) STEM images were recorded with a Hitachi SU 8030 scanning electron microscope in STEM mode with an electron acceleration voltage of 30 kV and a current of 20 µA. A droplet of a dispersion (c = 0.5–1 g/L) of the

Synthesis and characterization of quaternary La(Sr)S–TaS₂ misfit-layered nanotubes

• Marco Serra,
• Erumpukuthickal Ashokkumar Anumol,
• Dalit Stolovas,
• Iddo Pinkas,
• Ernesto Joselevich,
• Reshef Tenne,
• Andrey Enyashin and
• Francis Leonard Deepak

Beilstein J. Nanotechnol. 2019, 10, 1112–1124, doi:10.3762/bjnano.10.111

• electron microscopy (SEM) was done by LEO model Supra 55VP SEM. Transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) were performed on a Titan Themis 80-300 microscope with probe and image spherical aberration (Cs) correctors, at 200 kV. Energy-dispersive X-ray

CuInSe₂ quantum dots grown by molecular beam epitaxy on amorphous SiO₂ surfaces

• Henrique Limborço,
• Pedro M.P. Salomé,
• Rodrigo Ribeiro-Andrade,
• Jennifer P. Teixeira,
• Nicoleta Nicoara,
• Kamal Abderrafi,
• Joaquim P. Leitão,
• Juan C. Gonzalez and
• Sascha Sadewasser

Beilstein J. Nanotechnol. 2019, 10, 1103–1111, doi:10.3762/bjnano.10.110

• almost one order of magnitude. It is clear that with increasing growth temperature coarsening and In re-evaporation might play important roles in the nanodots size distribution. The crystal structure of the nanodots was determined by scanning transmission electron microscopy (STEM) analysis performed on

• electron microscopy (STEM) images were taken with a FEI Titan ChemiSTEM 80-200 kV Cs-probe corrected transmission electron microscope, operating at 200 kV accelerating potential and equipped with an energy-dispersive X-ray spectroscopy (EDS) SuperX-Bruker silicon drift detector. In this method a coherent

• this work we present samples prepared at substrate temperatures of 490, 530, and 580 °C; they will be referred to by their growth temperature. Characterization The surface morphology was determined by scanning electron microscopy (SEM) in a FEI Quanta 650 FEG SEM microscope. Scanning transmission

Synthesis of MnO₂–CuO–Fe₂O₃/CNTs catalysts: low-temperature SCR activity and formation mechanism

• Yanbing Zhang,
• Lihua Liu,
• Yingzan Chen,
• Xianglong Cheng,
• Chengjian Song,
• Mingjie Ding and
• Haipeng Zhao

Beilstein J. Nanotechnol. 2019, 10, 848–855, doi:10.3762/bjnano.10.85

• the results of NO conversion and of previous studies [6][16][17]. Scanning transmission electron microscopy STEM and element mapping were adopted to further investigate the morphology of the catalyst. As shown in Figure 5a, bright dots associated to the metal elements can be found, indicating the

Electrospun one-dimensional nanostructures: a new horizon for gas sensing materials

• Muhammad Imran,
• Nunzio Motta and
• Mahnaz Shafiei

Beilstein J. Nanotechnol. 2018, 9, 2128–2170, doi:10.3762/bjnano.9.202

• deposited directly onto a controlled and selective deposition area using a multifield electrospinning setup as shown in Figure 2. The scanning transmission electron microscopy (STEM) image confirms the uniform distribution of MoO3 NPs inside the electrospun fibers. Similarly, CuO NPs are embedded in

Optical near-field mapping of plasmonic nanostructures prepared by nanosphere lithography

• Gitanjali Kolhatkar,
• Alexandre Merlen,
• Jiawei Zhang,
• Chahinez Dab,
• Gregory Q. Wallace,
• François Lagugné-Labarthet and
• Andreas Ruediger

Beilstein J. Nanotechnol. 2018, 9, 1536–1543, doi:10.3762/bjnano.9.144

• intensity on the map [31]. The same principle is used with scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (EELS) [32][33][34]. This technique based on inelastic scattering measures the energy losses of the electrons. At the hot spots, the plasmon excitation results in

Noble metal-modified titania with visible-light activity for the decomposition of microorganisms

• Maya Endo,
• Zhishun Wei,
• Kunlei Wang,
• Baris Karabiyik,
• Kenta Yoshiiri,
• Paulina Rokicka,
• Bunsho Ohtani,
• Agata Markowska-Szczupak and
• Ewa Kowalska

Beilstein J. Nanotechnol. 2018, 9, 829–841, doi:10.3762/bjnano.9.77

• were modified with silver and gold by photodeposition, and characterized by diffuse reflectance spectroscopy (DRS), X-ray powder diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and scanning transmission electron microscopy (STEM). It was found that silver co-existed in zero valent (core) and

Bombyx mori silk/titania/gold hybrid materials for photocatalytic water splitting: combining renewable raw materials with clean fuels

• Stefanie Krüger,
• Michael Schwarze,
• Otto Baumann,
• Christina Günter,
• Michael Bruns,
• Christian Kübel,
• Dorothée Vinga Szabó,
• Rafael Meinusch,
• Verónica de Zea Bermudez and
• Andreas Taubert

Beilstein J. Nanotechnol. 2018, 9, 187–204, doi:10.3762/bjnano.9.21

• TEM with a LaB6 cathode operated at 120 kV. High resolution transmission electron microscopy (HRTEM) was done using an aberration corrected Titan 80-300 (FEI, Eindhoven, The Netherlands) with field emission gun, operated at 300 kV. Scanning transmission electron microscopy (STEM) and chemical analysis

Involvement of two uptake mechanisms of gold and iron oxide nanoparticles in a co-exposure scenario using mouse macrophages

• Dimitri Vanhecke,
• Dagmar A. Kuhn,
• Dorleta Jimenez de Aberasturi,
• Sandor Balog,
• Ana Milosevic,
• Dominic Urban,
• Diana Peckys,
• Niels de Jonge,
• Wolfgang J. Parak,
• Alke Petri-Fink and
• Barbara Rothen-Rutishauser

Beilstein J. Nanotechnol. 2017, 8, 2396–2409, doi:10.3762/bjnano.8.239

• a scanning transmission electron microscopy (STEM) detector (described in detail below). The water layer covering the cells was carefully thinned until it was sufficiently thin to allow for the detection of single NPs in a cell with the STEM detector located under the sample. In order to easier

Magnetic properties of optimized cobalt nanospheres grown by focused electron beam induced deposition (FEBID) on cantilever tips

• Soraya Sangiao,
• César Magén,
• Darius Mofakhami,
• Grégoire de Loubens and
• José María De Teresa

Beilstein J. Nanotechnol. 2017, 8, 2106–2115, doi:10.3762/bjnano.8.210

• analyze the chemical composition of the cobalt nanospheres by electron energy loss spectroscopy (EELS) in scanning transmission electron microscopy (STEM) mode and their local magnetic properties by electron holography in a transmission electron microscope (TEM), the specimens were prepared for TEM

AgCl-doped CdSe quantum dots with near-IR photoluminescence

• Pavel A. Kotin,
• Sergey S. Bubenov,
• Natalia E. Mordvinova and
• Sergey G. Dorofeev

Beilstein J. Nanotechnol. 2017, 8, 1156–1166, doi:10.3762/bjnano.8.117

• investigate the location of Ag and Cl in NPs, element distribution maps with the use of energy dispersion X-ray (EDX) spectroscopy were obtained (Figure 5). Figure 5a shows a high angle annular dark field (HAADF) image of sample AgCl_32, which was obtained with the use of scanning transmission electron

• microscopy (STEM). Figure 5–e display the position of Cd, Se, Ag and Cl atoms. The investigation was made on the day of the synthesis of NPs. The colour brightness of one selected pixel is determined by the intensity of L (Cd, Se and Ag) or K (Cl) line in EDX spectrum. The element distribution maps show that

Ion beam profiling from the interaction with a freestanding 2D layer

• Ivan Shorubalko,
• Kyoungjun Choi,
• Michael Stiefel and
• Hyung Gyu Park

Beilstein J. Nanotechnol. 2017, 8, 682–687, doi:10.3762/bjnano.8.73

• beam source. For imaging the milled pores we use scanning electron microscopy (SEM), scanning transmission electron microscopy (STEM) and helium ion microscopy (HIM). All methods give similar results regarding the measured focused ion beam profiles. Finally, we discuss technical limitations and